Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent
1984-11-27
1987-03-24
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Conductor identification or location
Inaccessible
324158D, 357 65, 357 68, G01R 3126
Patent
active
046528121
ABSTRACT:
Cathode migration is reduced by increasing the width of the cathode at its leading edge compared to the width of the anode at its leading edge. Electromigration to a specific degree may be measured by placing an additional conductor connected to the anode portion of the base conductor and separated from the anode by the base conductor. A rapid change in resistance can be sensed as the anode electrically migrates past the additional conductor.
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"Electromigration in Thin Gold Films on Molybdenum Surface"; Blech and Kinsbron, Thin Solid Films, vol. 25, pp. 327-334, 1975.
"Electromigration-Induced Failure by Edge Displacement in Fine-Line Aluminum-0.5% Copper Thin Film Conductors"; English and Kinsbron; Journal of Applied Physics, vol. 54, pp. 268-274, Jan. 1983.
George Elias W.
Gimpelson George E.
Baker Stephen M.
Eisenzopf Reinhard J.
Harris Corporation
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