Optics: measuring and testing – Lamp beam direction or pattern
Patent
1994-07-11
1996-02-20
Gonzalez, Frank
Optics: measuring and testing
Lamp beam direction or pattern
2502019, 2502081, G01J 100, G01J 120
Patent
active
054933919
ABSTRACT:
A 1-dimensional sensor for measuring wavefront distortion of a light beam as a function of time and spatial position includes a lens system which incorporates a linear array of lenses, and a detector system which incorporates a linear array of light detectors positioned from the lens system so that light passing through any of the lenses is focused on at least one of the light detectors. The 1-dimensional sensor determines the slope of the wavefront by location of the detectors illuminated by the light. The 1 dimensional sensor has much greater bandwidth that 2 dimensional systems.
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patent: 5233174 (1993-08-01), Zmek
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Michie Robert B.
Neal Daniel R.
Eisenberg Jason D.
Gonzalez Frank
Libman George H.
Sandia Corporation
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