One-chip compass implemented using magnetoresistive (MR)...

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Reexamination Certificate

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C073S504040

Reexamination Certificate

active

07112793

ABSTRACT:
A measurement technique for normalizing the sensitive-axis output of a magnetoresistive (MR) sensor which greatly reduces both temperature effects and magnetic contributions from the insensitive-axis cross-terms. Specifically, the normalization techniques disclosed may be effectuated by direct measurement with no prior knowledge of the sensor constants being required and may be performed for a single sensor with multiple sensors not being required in order to estimate the cross-axis fields for each of the other sensors. The technique can additionally provide an output proportional to the insensitive-axis field as well as that of the sensitive-axis and, when combined with knowledge of ambient field strengths, can be used to determine fundamental MR sensor constants which then allows for correction of higher-order sensor non-linearities. The techniques disclosed are particularly conducive to low power supply availability applications such as battery operation.

REFERENCES:
patent: 2005/0145795 (2005-07-01), Wright
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Kaplan, Ben-Zion, Paperno, Eugene, Flynn, David I., In-Plane Vector Magnetometer Employing a Single Unbiased Magnetoresistor, IEEE Transactions on Magnetics, vol. 34, No. 1, Jan. 1998, pp. 253-258.
Flynn, David I., A New Technique of Noise Reduction for Large Aspect Magnetoresistors, IEEE Transactions on Magnetics, vol. 30, No. 3, May 1994, pp. 1263-1266.
Paperno, Eugene, Kaplan, Ben-Zion, Simultaneous Measurement of Two DC Magnetic Field Components by a Single Magnetoresistor, IEEE Transactions on Magnetics, vol. 31, No. 3, May 1995, pp. 2269-2273.
Pant, Bharat B., Caruso, Mike, Magnetic Sensor Cross-Axis Effect, Honeywell, Apr. 1996, 6 pages.
Caruso, Michael J. Bratland, Tamara, Smith, Carl H., Schneider, Robert, A New Perspective on Magnetic Field Sensing, Honeywell, Inc., May 1998, pp. 1-19.
Magnetoresistive sensors for magnetic field measurement, Philips Semiconductors, Sep. 6, 2000, pp. 15-20.

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