Data processing: measuring – calibrating – or testing – Calibration or correction system – Length – distance – or thickness
Reexamination Certificate
2011-01-18
2011-01-18
Kundu, Sujoy K (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Length, distance, or thickness
C702S104000, C702S127000, C702S150000, C702S158000, C702S159000, C702S172000, C356S601000, C356S602000, C356S608000, C356S612000, C250S339110, C250S330000, C250S341800, C250S559220
Reexamination Certificate
active
07873488
ABSTRACT:
A chromatic point sensor (CPS) calibration object and characterizing data are provided. The calibration object comprises a flat base plane with steps extending from it. Step measurement points provided by the steps and base plane measurement points provided by portions of the base plane are intermingled along a measurement track. The characterizing data characterizes known heights of the measurement points. A calibration method acquires measurement data such that some base plane measurement points should be at nearly the same measurement distance and therefore have the same common mode errors relative to known base plane measurement point heights. If such base plane measurement points exhibit minimal error variations, then measurements for those and proximate measurement points may provide reliable calibration data. In contrast, error variations outside an expected range indicate unreliable measurements that should be screened or replaced by new calibration measurements.
REFERENCES:
patent: 4585349 (1986-04-01), Gross
patent: 4820048 (1989-04-01), Barnard
patent: 5379065 (1995-01-01), Cutts
patent: 5578745 (1996-11-01), Bayer
patent: 5644512 (1997-07-01), Chernoff
patent: 5785651 (1998-07-01), Kuhn
patent: 6016684 (2000-01-01), Scheer
patent: 6028008 (2000-02-01), Bayer
patent: 6029115 (2000-02-01), Tracy
patent: 6327041 (2001-12-01), Guern
patent: 6480285 (2002-11-01), Hill
patent: 6869480 (2005-03-01), Abel
patent: 7002143 (2006-02-01), Parker
patent: 2005/0030528 (2005-02-01), Geffen
patent: 2006/0024061 (2006-02-01), Wirth
patent: 2006/0109483 (2006-05-01), Marx
patent: 2006/0197949 (2006-09-01), Bouzid
patent: 2007/0148792 (2007-06-01), Marx et al.
patent: 2010/0225926 (2010-09-01), Van Amstel
patent: 42 11 875 (1993-10-01), None
patent: 102 28 477 (2004-01-01), None
patent: 10 2004 052 205 (2006-05-01), None
patent: 1 647 799 (2006-04-01), None
Sesko, D.W., “Dynamic Compensation of Chromatic Point Sensor Intensity Profile Data Selection,” U.S. Appl. No. 11/940,214, filed Nov. 14, 2007.
European Search Report mailed Mar. 6, 2009, issued in European Application No. EP 08 16 7845, filed Oct. 29, 2008, 4 pages.
Geary, J.M., “Introduction to Lens Design,” Willmann-Bell, Richmond, Va., 2002, p. 176.
Molesini, G., and F. Quercioli, “Pseudocolor Effects of Longitudinal Chromatic Aberration,” Journal of Optics (Paris) 17(6):279-282, Nov. 1986.
“Optical Pens: Micrometric Measurement Range,” STIL S.A., Aix-en-Provence, France, product brochure published on or before Mar. 6, 2007, 2 pages.
Smith, W.J., “Modern Optical Engineering,” 3d ed., SPIE Press—McGraw-Hill, New York, 2000, p. 94.
Villatoro, J., et al., “Fabrication and Modeling of Uniform-Waist Single-Mode Tapered Optical Fiber Sensor,” Applied Optics 42(13):2278-2283, May 2003.
Atherton Kim W.
Nahum Michael
Sesko David William
Christensen O'Connor Johnson & Kindness PLLC
Kundu Sujoy K
Mitutoyo Corporation
LandOfFree
On-site calibration method and object for chromatic point... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with On-site calibration method and object for chromatic point..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On-site calibration method and object for chromatic point... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2696318