Data processing: measuring – calibrating – or testing – Calibration or correction system – Sensor or transducer
Reexamination Certificate
2011-08-30
2011-08-30
Lau, Tung S (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Sensor or transducer
Reexamination Certificate
active
08010309
ABSTRACT:
A method of analysis, analysis system, program product, apparatus, and method of supplying analysis of value incorporating the use of at least one data acquisition device, a central processor, and a communication link that is connectable between the data acquisition device and the central processor. The central processor is loaded with multivariate calibration models developed for predicting values for various properties of interest, wherein the calibration models are capable of compensating for variations in an effectively comprehensive set of measurement conditions and secondary material characteristics. As so configured, the calibration models can compensate for instrument variance without instrument-specific calibration transfer. Measurement results generated by the central processor can be transmitted to an output device of a user interface.
REFERENCES:
patent: 2002/0042274 (2002-04-01), Ades
Hall Allen L.
Lundstedt Alan P.
Tseng Ching-Hui
Cognis IP Management GmbH
Diehl Servilla LLC
Lau Tung S
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