On die thermal sensor of semiconductor memory device and...

Details On die thermal sensor of semiconductor memory device and... On die thermal sensor of semiconductor memory device and...

2011-05-31

2011-05-31

Feliciano, Eliseo Ramos (Department: 2857)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Temperature

C702S071000, C702S104000, C702S130000, C374S141000, C327S512000, C324S765010, C324S1540PB

Reexamination Certificate

active

07953569

ABSTRACT:
An on die thermal sensor (ODTS) includes a thermal sensor for outputting a first comparing voltage by detecting a temperature of the semiconductor memory device; a comparing unit for outputting a trimming code by comparing the first comparing voltage with a second comparing voltage and increasing or decreasing a preset digital code in response to the comparing result; and a voltage level adjusting unit for adjusting a voltage level of the second comparing voltage by determining a maximum variation voltage and a minimum variation voltage based on the trimming code and a temperature control code.

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