On die thermal sensor of semiconductor memory device

Details On die thermal sensor of semiconductor memory device On die thermal sensor of semiconductor memory device

2006-12-28

2011-10-25

Verbitsky, Gail (Department: 2855)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C327S513000, C374S178000, C374S141000, C365S222000

Reexamination Certificate

active

08042999

ABSTRACT:
An on die thermal sensor (ODTS) of a semiconductor memory device includes a high voltage generating unit for generating a high voltage having a voltage level higher than that of a power supply voltage of the semiconductor memory device; and a thermal information output unit for sensing and outputting a temperature as a thermal information code, wherein the thermal information output unit uses the high voltage as its driving voltage.

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