Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-06-29
2009-10-20
Dunn, Drew A (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S099000, C702S130000, C327S512000, C327S539000
Reexamination Certificate
active
07606674
ABSTRACT:
An on die thermal sensor includes a bandgap unit for generating a first voltage containing temperature information, a tracking unit for tracking a voltage level of the first voltage, and a low power control unit for generating a tracking enable signal for enabling the tracking unit and disabling the tracking unit after a minimum tracking operation time of the tracking unit elapses.
REFERENCES:
patent: 6531911 (2003-03-01), Hsu et al.
patent: 6876250 (2005-04-01), Hsu et al.
patent: 7138823 (2006-11-01), Janzen et al.
patent: 2006/0111865 (2006-05-01), Choi
patent: 2006/0158214 (2006-07-01), Janzen et al.
patent: 2007/0040574 (2007-02-01), Janzen et al.
patent: 2007/0098041 (2007-05-01), Seo
patent: 10-255467 (1998-09-01), None
patent: 10-2004-0080357 (2004-09-01), None
patent: 10-2005-0114938 (2005-12-01), None
patent: 10-2006-0042703 (2006-05-01), None
Korean Office Action, issued in Korean Patent Application No. 10-2006-0106113, dated on Feb. 1, 2008.
Dunn Drew A
Hynix / Semiconductor Inc.
IP & T Law Firm PLC
Vo Hien X
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