On-die temperature monitoring in semiconductor devices to...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Specific application of temperature responsive control system

Reexamination Certificate

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Details

C700S108000, C700S205000, C702S130000, C702S131000, C702S132000, C713S501000

Reexamination Certificate

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11088445

ABSTRACT:
Thermal control for a controller in a data processing environment is described. In one embodiment, the invention includes detecting a temperature of a semiconductor device at a thermal sensor on the semiconductor device, comparing the detected temperature to a threshold, and generating a high interrupt if the temperature is above the threshold and a low interrupt if the temperature is below the threshold.

REFERENCES:
patent: 5281026 (1994-01-01), Bartilson et al.
patent: 6421754 (2002-07-01), Kau et al.
patent: 6701272 (2004-03-01), Cooper et al.
patent: 2006/0066384 (2006-03-01), Jain et al.

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