On-chip variance detection for integrated circuit devices

Details On-chip variance detection for integrated circuit devices On-chip variance detection for integrated circuit devices

1994-04-11

1996-05-14

Nguyen, Vinh P.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324716, 324719, G01R 2722

Patent

active

055171079

ABSTRACT:
A process variance detection technique for detecting fabrication processing variances in integrated circuit components, such as resistors or MOSFETs, is based on the decreased sensitivity to processing variations exhibited by components that are up-sized relative to similar components with nominal dimensions. Detection circuitry includes detection components with both nominal and up-sized dimensions, and variance detection involves detecting the differences in operational response of the nominal and up-sized detection components. For bipolar logic, resistors are fabricated with up-sized widths, while for MOS logic, MOSFETs are fabricated with up-sized gate lengths.

REFERENCES:
patent: 3808527 (1974-04-01), Thomas
patent: 4144493 (1979-03-01), Lee et al.
patent: 4347479 (1982-08-01), Cullet
patent: 4516071 (1985-05-01), Buchler
patent: 4542340 (1985-09-01), Chakravarti et al.
patent: 4672314 (1987-06-01), Kokkas
patent: 4835466 (1989-05-01), Maly et al.
patent: 4855253 (1989-08-01), Weber
patent: 4906921 (1990-03-01), Fuge
patent: 4918377 (1990-04-01), Buehler et al.
patent: 4933635 (1990-06-01), Deutsch et al.
patent: 4956611 (1990-09-01), Maltiel
patent: 4967146 (1990-10-01), Morgan et al.
patent: 4994736 (1991-02-01), Davis et al.
patent: 5051690 (1991-09-01), Maly et al.
patent: 5082792 (1992-01-01), Pasch et al.
patent: 5247262 (1993-09-01), Cresswell et al.
IBM Technical Disclosure Bulletin, vol. 17, No. 10, Mar. 1975, New York, pp. 2905-2907, J. H. Lee and A. V. S. Satya "Three-Device FET Diagnostic Testing Scheme".

Affiliated with

Also associated with

Rating

On-chip variance detection for integrated circuit devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with On-chip variance detection for integrated circuit devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On-chip variance detection for integrated circuit devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1898556