On-chip transistor degradation monitoring

Details On-chip transistor degradation monitoring On-chip transistor degradation monitoring

2007-04-17

2007-04-17

Shingleton, Michael B (Department: 2817)

Oscillators

Ring oscillators

C324S763010, C716S030000

Reexamination Certificate

active

10745427

ABSTRACT:
Embodiments of the invention include on-chip characterization of transistor degradation. In one embodiment, includes one or more functional blocks to perform one or more functions and an integrated on-chip characterization circuit to perform on-chip characterization of transistor degradation. The integrated on-chip characterization circuit includes a selectively enabled ring oscillator to generate a reference oscillating signal, a free-running ring oscillator to generate a free-running oscillating signal, and a comparison circuit coupled to the selectively enabled ring oscillator and the free-running ring oscillator. From the reference oscillating signal and the free-running oscillating signal, the comparison circuit determine a measure of transistor degradation.

REFERENCES:
patent: 6535013 (2003-03-01), Samaan
patent: 6724268 (2004-04-01), Takahashi
patent: 6903564 (2005-06-01), Suzuki
patent: 2005/0134394 (2005-06-01), Liu
patent: 2005/0140418 (2005-06-01), Munlandy et al.
U.S. Appl. No. 11/096,777, filed Mar. 31, 2005, Liu et al.

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