On-chip test circuit and method for an image sensor array

Details On-chip test circuit and method for an image sensor array On-chip test circuit and method for an image sensor array

1994-11-14

1995-09-19

Westin, Edward P.

Radiant energy

Photocells; circuits and apparatus

Photocell controlled circuit

348313, 2502081, H01J 4014

Patent

active

054517680

ABSTRACT:
A test system for a photosensitive array includes an on-board test circuit with a single input terminal, wherein the output of the test circuit directly affects the value of a bias charge placed on a selected photodiode. The test circuit enables a quick test for the presence of a desired bias charge when a digital-high voltage is entered on the single input terminal, and also enables a more precise test of photodiode response linearity by application of a predetermined analog voltage to the single input terminal.

REFERENCES:
patent: 4509077 (1985-04-01), Therrien
patent: 4897817 (1990-01-01), Katanoska
patent: 5057682 (1991-10-01), Michon et al.
patent: 5081536 (1992-01-01), Tandon et al.
patent: 5285286 (1994-02-01), Kannegundla

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