Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent
1991-08-29
1992-10-13
Cuchlinski, Jr., William A.
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
357 10, 357 15, 357 28, G01K 700, H01L 31108, H01L 2714
Patent
active
051545144
ABSTRACT:
A temperature sensor, comprising: a diode structure including, a) a silicon substrate, b) a first region of a metal silicide in the silicon substrate, c) a second region of a metal-oxide semiconductor material on the first region, d) a third region of a metal over the second region; and, means for using the diode structure as a temperature sensitive device to measure an ambient temperature. The metal-oxide semiconductor material is preferably selected to have a bandgap of not less than about 3.0 eV.
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Gambino Jeffrey P.
Hsu Louis L.
Lee Michael A.
Seshan Krishna
Sugerman Alvin
Brandt Jeffrey L.
Cuchlinski Jr. William A.
Gutierrez Diego F. F.
Huberfeld Harold
International Business Machines - Corporation
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