Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-10-24
2006-10-24
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S099000, C702S136000, C327S512000, C327S513000
Reexamination Certificate
active
07127368
ABSTRACT:
An on-chip temperature sensor for a semiconductor device. A temperature sensing mechanism includes a first current generator producing a first current that is proportional to absolute temperature of the semiconductor device. A second current generator produces a second current that is inversely proportional to absolute temperature of the semiconductor device. A current mode amplifier is coupled to amplifying the difference between the first current and the second current to produce a temperature signal.
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Bui Bryan
Jorgenson Lisa K.
Kubida William J.
STMicroelectronics Asia Pacific Pte. Ltd.
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