Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2007-05-11
2008-11-18
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C374S170000, C327S513000, C702S130000
Reexamination Certificate
active
07452128
ABSTRACT:
A device temperature measurement circuit, an integrated circuit (IC) including a device temperature measurement circuit, a method of characterizing device temperature and a method of monitoring temperature. The circuit includes a constant current source and a clamping device. The clamping device selectively shunts current from the constant current source or allows the current to flow through a PN junction, which may be the body to source/drain junction of a field effect transistor (FET). Voltage measurements are taken directly from the PN junction. Junction temperature is determined from measured junction voltage.
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Franch Robert L.
Jenkins Keith A.
International Business Machines - Corporation
Law Office of Charles W. Peterson, Jr.
Percello, Esq. Louis J.
Verbitsky Gail
Verminski, Esq. Brian P.
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