On-chip temperature measurement technique

Details On-chip temperature measurement technique On-chip temperature measurement technique

2005-08-23

2005-08-23

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Temperature

C702S130000, C702S132000, C377S019000, C377S025000

Reexamination Certificate

active

06934652

ABSTRACT:
A temperature monitoring technique that eliminates the need for bipolar devices. In one embodiment of the present invention, a long-channel MOS transistor is configured in a diode connection to sense change in temperature. The diode drives a linear regulator and an oscillator. The oscillator in turn drives a counter, which counts pulses for a fixed period of time. The system clock on the chip is used as a temperature-independent frequency to generate a count. The temperature-dependent frequency is counted for a fixed number of system clock cycles. The present invention eliminates band gap circuitry currently used in most thermal sensing devices to provide a temperature-independent reference.

REFERENCES:
patent: 5499214 (1996-03-01), Mori et al.
patent: 5638418 (1997-06-01), Douglass et al.
patent: 6115441 (2000-09-01), Douglass et al.
patent: 6476632 (2002-11-01), La Rosa et al.
patent: 2003/0155903 (2003-08-01), Gauthier et al.

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