On-chip self-test circuit

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 731, 371 226, G06F 1100

Patent

active

052026264

ABSTRACT:
An on-chip self-test circuit has been provided that allows for accurately testing a device such as prescaler at high frequencies. The on-chip self-test circuit includes a voltage controlled oscillator for providing high frequency signals to the device under test.
The on-chip self-test circuit is rendered active only when one desires to test the device. Thus, when not testing, the on-chip self-test circuit is transparent to the device and consumes substantially zero power.

REFERENCES:
patent: 4123704 (1978-10-01), Johnson
patent: 4207791 (1980-06-01), Murakami
patent: 4553109 (1985-11-01), Hyatt
patent: 4724380 (1988-02-01), Burrows et al.
patent: 5006787 (1991-06-01), Katircioglu et al.
patent: 5099196 (1992-03-01), Longwell et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

On-chip self-test circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with On-chip self-test circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On-chip self-test circuit will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1157745

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.