On-chip self-test circuit

Details On-chip self-test circuit On-chip self-test circuit

1991-10-25

1993-04-13

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 226, G06F 1100

Patent

active

052026264

ABSTRACT:
An on-chip self-test circuit has been provided that allows for accurately testing a device such as prescaler at high frequencies. The on-chip self-test circuit includes a voltage controlled oscillator for providing high frequency signals to the device under test.
The on-chip self-test circuit is rendered active only when one desires to test the device. Thus, when not testing, the on-chip self-test circuit is transparent to the device and consumes substantially zero power.

REFERENCES:
patent: 4123704 (1978-10-01), Johnson
patent: 4207791 (1980-06-01), Murakami
patent: 4553109 (1985-11-01), Hyatt
patent: 4724380 (1988-02-01), Burrows et al.
patent: 5006787 (1991-06-01), Katircioglu et al.
patent: 5099196 (1992-03-01), Longwell et al.

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