On-chip probing apparatus

Details On-chip probing apparatus On-chip probing apparatus

2006-12-06

2008-10-28

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07443180

ABSTRACT:
The invention is directed to an on-chip probing apparatus. In accordance with an embodiment of the present invention, the on-chip probing apparatus includes: a plurality of switches on a chip; a plurality of externally accessible probe points on the chip; and a multiplexer for controlling the plurality of switches to selectively couple an output signal of the chip to one of the plurality of probe points.

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