On chip performance predictor circuit

Details On chip performance predictor circuit On chip performance predictor circuit

1986-12-23

1988-01-19

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, G01R 3102

Patent

active

047206705

ABSTRACT:
An on chip monitoring circuit is disclosed which enables the rapid characterization of signal propagation speed for integrated circuits on the same chip. The circuit is based upon a correlation between signal propagation speed on the chip and the low pass filtering characteristics of the monitoring circuit, which is a classical first order low pass filter. The monitoring circuit performs the low pass filter operation from which the operator can determine what the signal propagation characteristics are for other integrated circuits on the chip resulting from specific process parameters which occurred during the fabrication of the chip. A feature of the invention is its ability to characterize very small capacitive and resistive contributions to signal propagation delay by using input driving frequencies which are moderately low, by using the principle of the Miller Theorem. The monitoring circuit enables the rapid and accurate characterization of signal propagation delays for integrated circuits both during manufacture and during the life of the integrated circuit chip.

REFERENCES:
patent: 4631421 (1986-12-01), Inoue et al.

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