On-chip over-temperature detection

Details On-chip over-temperature detection On-chip over-temperature detection

2007-10-31

2010-06-08

Tsai, Carol S (Department: 2857)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Temperature

C702S057000, C702S104000, C702S107000

Reexamination Certificate

active

07734440

ABSTRACT:
An improved method and apparatus for setting a trip-point temperature value for detection of an over-temperature condition in a chip when a reading from a main temperature sensor exceeds the trip-point temperature value. In one embodiment, the trip-point temperature value is set to a known temperature limit value offset by a temperature difference, ΔT. ΔT is calculated by taking the difference between a reading of the main temperature sensor and a reading of another temperature sensor, remote from the main temperature sensor, while a heat-generating circuit is enabled. The main temperature sensor is distal from heat-generating circuit on the chip and the remote temperature sensor is proximate the heat-generating circuit. For multiple heat-generating circuits on the chip, a ΔT is determined for each of the heat-generating circuits, and the largest ΔT is used to calculate the trip-point temperature value. Advantageously, the largest ΔT determination may be done only once.

REFERENCES:
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patent: 5886515 (1999-03-01), Kelly
patent: 6144085 (2000-11-01), Barker
patent: 7187053 (2007-03-01), Boerstler et al.
patent: 7356426 (2008-04-01), Jain et al.

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