Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2007-05-30
2008-08-05
Jackson, Stephen W (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
C361S091100, C361S111000, C361S018000
Reexamination Certificate
active
07408752
ABSTRACT:
A low loading capacitance on-chip electrostatic discharge (ESD) protection circuit for compound semiconductor power amplifiers is disclosed, which does not degrade the circuit RF performance. Its principle of operation and simulation results regarding capacitance loading, leakage current, degradation to RF performance are disclosed. The design, loading effect over frequency, robustness over process and temperature variation and application to an RF power amplifier is presented in detail. The ESD circuit couples an input to ground during ESD surges through a diode string coupled to the input, and a transistor switch or Darlington pair having its gate coupled to and triggered by the diode string. The Darlington pair couples the input to ground when triggered through a low impedance path in parallel to the diode string. A reverse diode also couples ground to the input on reverse surges.
REFERENCES:
patent: 5774318 (1998-06-01), McClure et al.
patent: 6529059 (2003-03-01), Davis
patent: 7280332 (2007-10-01), Ma et al.
patent: 2002/0130392 (2002-09-01), Brennan et al.
Li Guann Pyng
Ma Yin Tat
Dawes Daniel L.
Jackson Stephen W
Myers Dawes Andras & Sherman LLP
Patel Dharti H
The Regents of the University of California
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