Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-08-03
1995-11-21
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
361111, 365190, G01R 3102
Patent
active
054690650
ABSTRACT:
A memory cell system is disclosed with properties of asymmetrical operation such that the occurrence of memory error due to certain environmental disturbances is detectable. The asymmetry of operation can be adjusted to set the level at which the disturbance is detected. Detection of memory error in the system can be used to shut off access to an associated memory array in order to prevent error in the array.
REFERENCES:
patent: 4670714 (1987-06-01), Sievers et al.
patent: 4685086 (1987-08-01), Tran
patent: 5053996 (1991-10-01), Slemmer
patent: 5070426 (1991-12-01), Iwasa et al.
patent: 5084873 (1992-01-01), Houston
patent: 5157335 (1992-10-01), Houston
patent: 5361033 (1994-11-01), Houston
Donaldson Richard L.
Garner Jacqueline J.
Hiller William E.
Texas Instruments Incorporated
Tobin Christopher M.
LandOfFree
On chip capacitor based power spike detection does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with On chip capacitor based power spike detection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On chip capacitor based power spike detection will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1139996