Omnidirectional eddy current probes, array probes, and...

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S240000, C324S243000

Reexamination Certificate

active

06888347

ABSTRACT:
An omnidirectional eddy current probe includes a number of sense coils arranged in a stack having a principal axis. At least two of the sense coils are rotationally skewed about the principal axis relative to one another. The sense coils are operatively connected to each other and a drive coil is also positioned in the stack. An impulse through the drive coil induces a magnetic influx through a conducting material specimen having a surface, thereby generating eddy currents on the surface. Secondary magnetic field generated from the eddy currents produces corresponding signals in the sense coils, and the signals are then analyzed for the possibility of surface flaw in the conducting material.

REFERENCES:
patent: 3876932 (1975-04-01), Domon et al.
patent: 5006801 (1991-04-01), Young
patent: 5182513 (1993-01-01), Young et al.
patent: 5262722 (1993-11-01), Hedengren et al.
patent: 5334934 (1994-08-01), Viertl
patent: 5345514 (1994-09-01), Mahdavieh et al.
patent: 5389876 (1995-02-01), Hedengren et al.
patent: 5418547 (1995-05-01), Mizukata et al.
patent: 5430376 (1995-07-01), Viertl
patent: 5442286 (1995-08-01), Sutton, Jr. et al.
patent: 5659248 (1997-08-01), Hedengren et al.
patent: 5903147 (1999-05-01), Granger, Jr. et al.
patent: 6175234 (2001-01-01), Granger, Jr. et al.
patent: 6414483 (2002-07-01), Nath et al.
patent: 6456066 (2002-09-01), Burd et al.
patent: 0518635 (1992-12-01), None
patent: 2109112 (1983-05-01), None
Patent Abstract of Japan, 2003240762A, H. Tatsuo, “Probe for Eddy Current Flaw Detection and Eddy Current Flaw Detecting Apparatus Using The Same”, vol. 2003, No. 12, Aug. 27, 2003.
European Search Report, EP04255457, D. Joyce, Nov. 12, 2004.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Omnidirectional eddy current probes, array probes, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Omnidirectional eddy current probes, array probes, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Omnidirectional eddy current probes, array probes, and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3431785

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.