Omnidirectional eddy current probe and inspection system

Details Omnidirectional eddy current probe and inspection system Omnidirectional eddy current probe and inspection system

2006-03-21

2006-03-21

LeDynh, Bot (Department: 2862)

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

C324S243000, C324S260000

Reexamination Certificate

active

07015690

ABSTRACT:
An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.

REFERENCES:
patent: 3437918 (1969-04-01), Arnelo
patent: 3875502 (1975-04-01), Neumaier
patent: 4310821 (1982-01-01), Frances
patent: 4706020 (1987-11-01), Viertl et al.
patent: 5047719 (1991-09-01), Johnson et al.
patent: 5182513 (1993-01-01), Young et al.
patent: 5262722 (1993-11-01), Hedengren et al.
patent: 5315234 (1994-05-01), Sutton, Jr. et al.
patent: 5371461 (1994-12-01), Hedengren
patent: 5371462 (1994-12-01), Hedengren et al.
patent: 5389876 (1995-02-01), Hedengren et al.
patent: 5442286 (1995-08-01), Sutton, Jr. et al.
patent: 5463201 (1995-10-01), Hedengren et al.
patent: 5659248 (1997-08-01), Hedengren et al.
patent: 5793206 (1998-08-01), Goldfine et al.
patent: 5801532 (1998-09-01), Patton et al.
patent: 5831431 (1998-11-01), Gottfried-Gottfried et al.
patent: 5903147 (1999-05-01), Granger, Jr. et al.
patent: 5966011 (1999-10-01), Goldfine et al.
patent: 6188218 (2001-02-01), Goldfine et al.
patent: 6344739 (2002-02-01), Hardy et al.
patent: 6414483 (2002-07-01), Nath et al.
patent: 2005/0007106 (2005-01-01), Goldfine et al.
patent: 0512796 (1997-08-01), None
patent: 2262607 (1993-06-01), None
patent: 0047986 (2000-08-01), None
EP Search Report, EP05253068, Jul. 22, 2005.

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