Omnidirectional capacitive probe for gauge of having a sensing t

Details Omnidirectional capacitive probe for gauge of having a sensing t Omnidirectional capacitive probe for gauge of having a sensing t

1992-05-26

1994-05-24

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324662, 324686, G01R 2726

Patent

active

053152590

ABSTRACT:
A non-contact, omni-directional capacitive probe for use in dimensional gauging includes an electrically conductive spherical sensing tip that forms a capacitor with a workpiece, the capacitance of the capacitor being indicative of the distance between the spherical sensing tip and the workpiece.

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Technical literature for an "OMNISIP" Probe as manufactured by American SIP Corporation, Nov., 1988, pp. 1-5.

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