Offset measuring method

Dynamic information storage or retrieval – With servo positioning of transducer assembly over track... – Optical servo system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C369S044320, C369S044350

Reexamination Certificate

active

07035175

ABSTRACT:
An offset measuring method is for measuring an offset based on an optical beam reflected by an information medium, in a recording and reproduction apparatus including an optical pickup placed on transportation means so as to be driven along a radial direction of the information medium. The method includes the steps of directing an optical beam toward a first measuring position, thereby measuring a first offset amount based on the optical beam reflected at the first measuring position; moving the transportation means by a first distance in a first direction along the radial direction; driving the optical pickup by a second distance, which is equal to the first distance, in a second direction; and directing an optical beam toward a second measuring position, thereby measuring a second offset amount based on the optical beam reflected at the second measuring position.

REFERENCES:
patent: 5481526 (1996-01-01), Nagata et al.
patent: 5499223 (1996-03-01), Yanagi et al.
patent: 5627808 (1997-05-01), Hajjar et al.
patent: 5917789 (1999-06-01), Iwasaki et al.
patent: 6147944 (2000-11-01), Kwon et al.
patent: 6452879 (2002-09-01), Tsukahara et al.
patent: 2002/0021632 (2002-02-01), Park
patent: 08-194540 (1996-07-01), None
patent: 2000-251289 (2000-09-01), None
patent: 2000-222749 (2000-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Offset measuring method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Offset measuring method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Offset measuring method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3541129

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.