Offset calibration of a flash ADC array

Details Offset calibration of a flash ADC array Offset calibration of a flash ADC array

1998-06-10

2000-07-04

Young, Brian

Coded data generation or conversion

Converter calibration or testing

341118, H03M 110, H03M 106

Patent

active

060845384

ABSTRACT:
A system and method is disclosed for calibrating comparators of an ADC. Individual comparators may be calibrated at random or psuedo-random times while the ADC is performing conversions without the addition of extra "proxy" or replacement comparators. More particularly, at periodic intervals a psuedo-random one of the comparators may be disconnected from the standard ADC circuitry for calibration. In order to prevent a significant degradation in the conversion quality, the digital logic downstream of the comparators may be designed to provide the necessary adjustments to accommodate for the removal of one of the comparators. Thus, a calibration technique is provided in which individual comparators are removed from the data conversion path during conversion and the downstream logic adjusts to accommodate for the removal of the comparator. The calibration technique is particularly advantageous for use with optical data storage systems.

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