Offset amount measuring method and apparatus

Dynamic information storage or retrieval – Condition indicating – monitoring – or testing – Including radiation storage or retrieval

Reexamination Certificate

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C369S053220

Reexamination Certificate

active

07548499

ABSTRACT:
An offset amount measuring method is provided with: a recording process for measurement (i) of recording information for measurement, into a recording track in the L0layer, by a predetermined section, from a measurement reference position, and of (ii) recording the information for measurement, into a recording track in the L1layer, by the predetermined section, from or toward a measurement correspondence position, which is associated with the measurement reference position by the pre-format address; a first detecting process of detecting a border of a first recorded area in which the information for measurement is recorded and a first unrecorded area in the first recording track, on the basis of a difference in reflectance between the first recorded area and the first unrecorded area; a second detecting process of detecting a second border position in the recording track in the L1layer, on the basis of a difference in reflectance; and a determining process of determining the offset amount, on the basis of the detected first and second border positions. Moreover, it is also provided with a judging process of judging whether or not the determined offset amount is within tolerance with respect to the first offset amount set in advance for offset countermeasures.

REFERENCES:
patent: 7215634 (2007-05-01), Van Woudenberg
patent: 2002/0110068 (2002-08-01), Araki et al.
patent: 2004/0196776 (2004-10-01), Yoshida et al.
patent: 2000-311346 (2000-11-01), None
patent: 2001-23237 (2001-01-01), None
patent: 2003-242653 (2003-08-01), None

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