Off axis rotation of diffraction grating

Details Off axis rotation of diffraction grating Off axis rotation of diffraction grating

1989-02-17

1991-05-14

Bovernick, Rodney B.

Optics: measuring and testing

Range or remote distance finding

With photodetection

35016223, 350 65, 356319, G02B 518, G02B 2606

Patent

active

050150693

ABSTRACT:
In a spectrophotometer application where high speed positioning is critical, a galvanometer in conjunction with a microprocessor controlled hybrid digital/analog servo system is used to rotate a diffraction grating for wavelength selection. A table containing digital position information for all wavelengths is accessed by the microprocessor to perform wavelength changes. The use of the table permits the determination of grating position to yield a desired wavelength for a system where the axis of rotation does not intersect a point on the surface of the diffraction grating. That is, the diffraction grating can be rotated about an axis coinciding with its center of gravity.

REFERENCES:
patent: 4443055 (1984-04-01), Matsuoka et al.
patent: 4669878 (1987-06-01), Meier
patent: 4775205 (1988-10-01), Muramatsu

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