Optics: eye examining – vision testing and correcting – Eye examining or testing instrument
Reexamination Certificate
2007-11-20
2007-11-20
Sugarman, Scott J. (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
C351S202000, C351S209000, C351S210000, C351S246000, C351S211000
Reexamination Certificate
active
11015417
ABSTRACT:
An ocular accommodative function examination apparatus for examining an accommodative function of an examinee's eye, comprises: a fixation target presenting optical system which presents a fixation target at a presenting position to the eye, the presenting position being changeable in a direction of a visual axis of the eye; a refractive power measuring optical system which measures refractive power of the eye and includes a light projecting optical system which includes a light source and projects examination light to a fundus of the eye and a light receiving optical system which includes a light receiving element and receives the examination light reflected from the fundus; an analysis part which acquires variation in the refractive power of the eye gazing at the fixation target at a certain presenting position within a predetermined time based on output of the light receiving element, and determines the accommodative function including a range of accommodation and HFC (a frequency of occurrence of a high frequency component of accommodative microfluctuation) of the eye based on an acquired result; and an output part which outputs a result determined by the analysis part, wherein the analysis part determines presence/absence of accommodative constriction and presence/absence of accommodative spasm based on the determined range of accommodation and HFC.
REFERENCES:
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patent: 6120461 (2000-09-01), Smyth
patent: 6361168 (2002-03-01), Fujieda
patent: 2003070740 (2003-03-01), None
patent: A 2003-070740 (2003-03-01), None
Suzuki et al., “Evaluation of Accommodative Function by High Frequency Component of Accomodative Microfluctuation,”Jpn. J. Vis. Sci., vol. 22, No. 3, pp. 93-97 (Nov. 8, 2001).
Hanaki Miwako
Hayashi Akihiro
Isogai Naoki
Greece James R
Nidek Co. Ltd.
Oliff & Berridg,e PLC
Sugarman Scott J.
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