Observer based Q -control imaging methods for atomic force...

Details Observer based Q -control imaging methods for atomic force... Observer based Q -control imaging methods for atomic force...

2007-04-27

2009-12-01

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Chemical analysis

C702S127000, C702S189000, C073S105000

Reexamination Certificate

active

07627438

ABSTRACT:
An observer based Q control method for a cantilever in an atomic force microscopy is provided that provides for a “dual” Q behavior such that a particular effective Q is achieved when a sample is present and another effective Q when a sample is absent. In the control method, the transfer function from dither input to photo-diode output is independent of the observer so that the cantilever effectively behaves like a spring-mass-damper system. The effective quality factor and stiffness of the cantilever can be changed by appropriately choosing the state feedback gain. The method provides sample-imaging using transient atomic force microscopy.

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