Observation or measurement means and observation or...

Optical: systems and elements – Lens – Microscope objective

Reexamination Certificate

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C359S368000

Reexamination Certificate

active

07602555

ABSTRACT:
An observation or measurement device has, at least, an infinity-corrected objective lens and an imaging lens, and satisfies a condition, 4.56≦D·NA′≦30 (mm), where D is the parfocal distance of the objective lens and NA′ is the numerical aperture of the imaging lens. It is desirable to make a distance from the mount position of the objective lens to the most object-side surface of the imaging lens variable and to satisfy a condition, 0.5 FL<W<1.2 FL (mm), where W is the variable amount of the distance from the mount position of the objective lens to the most object-side surface of the imaging lens, and FL is the focal length of the imaging lens. It is more desirable to satisfy conditions, 0.4<D/FL<5 and 1≦D/φd<3, where φd is the outside diameter of a connection at the mount of the objective lens.

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patent: 6128128 (2000-10-01), Otaki et al.
patent: 6560032 (2003-05-01), Hatano
patent: 6674574 (2004-01-01), Aono
patent: 6754008 (2004-06-01), Wallerstein et al.
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patent: 11-231224 (1999-08-01), None
patent: 2001-021812 (2001-01-01), None

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