Observation and/or failure inspection apparatus, method and...

Details Observation and/or failure inspection apparatus, method and... Observation and/or failure inspection apparatus, method and...

2005-12-06

2005-12-06

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C714S001000

Reexamination Certificate

active

06973395

ABSTRACT:
An observation apparatus according to one embodiment can include a timing generating unit (2) that generates a timing signal at a predetermined period. A sampling unit (3) can sample a current observation signal of a power supply current on the basis of the timing signal, and store sampled data in data storing unit (5). A data number adjusting unit (6) can adjust the number of data samples to a number that is a power of two. An arithmetic operating unit (4) can Fourier-transform the adjusted data to generate frequency spectrum results of the current observation signal. In addition, a failure inspection apparatus according to one embodiment analyzes the frequency spectrum of an integrated circuit under observation to determine a failure condition of the integrated circuit.

REFERENCES:
patent: 5301122 (1994-04-01), Halpern

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