Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1996-12-20
1998-04-14
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
21912434, 2502016, G01B 1124
Patent
active
057399123
ABSTRACT:
A method and apparatus for object profiling is disclosed wherein a laser beam generated by a laser diode 102 is directed to the object surface 101, the apparatus scans the surface 101 and receives the illuminated point image by a charge storage type one-dimensional array of light receiving elements 107; the array 107 is scanned every predetermined period so as to sense a position of the illuminated point image; the object surface coordinates are then obtained by the principle of triangulation, and thereby profile of the object surface 101 can be measured. The laser beam generated by laser diode 102 is intermittent such that the beam is turned on/off at intervals of a predetermined time, preferably ranging from 10 ns to 100 ns. The received signal during unilluminated (turned-off) period delays one period via the FIFO 119-3, while that during the illuminated (turned-on) period is supplied to the subtraction unit 119-6 without delay. The subtraction unit 119-6 subtracts the signal of the unilluminated period from that of the illuminated period. The external interference light due to arc light of a welding torch, etc., ordinarily having a fluctuation frequency of much lower than 100 kHz, irradiates the array 107 at an almost equal intensity in both of the illuminated and unilluminated periods, so that the interference components can be eliminated by subtraction.
REFERENCES:
patent: 4065788 (1977-12-01), Meier et al.
patent: 4388646 (1983-06-01), Strother
patent: 4410787 (1983-10-01), Kremers et al.
patent: 4419012 (1983-12-01), Stephenson et al.
patent: 4480919 (1984-11-01), Asano et al.
patent: 4567347 (1986-01-01), Ito et al.
patent: 5151608 (1992-09-01), Torii et al.
patent: 5173750 (1992-12-01), Laukaitis
patent: 5198877 (1993-03-01), Schulz
Patent Abstracts of Japan, vol. 8, No. 269 (P-319) (1706) 8 Dec. 1984, and JP-A-59 137 805 (Shinmeiwa Kogyo) 8 Aug. 1984.
Patent Abstracts of Japan, vol. 9, No. 83 (P-348) (1806) 12 Apr. 1985 and JP-A-59 212 703 (Matsushita Denki Sangyo) 1 Dec. 1984.
Technisches Messen TM, vol. 51, No. 7/8, Jul. 1984, Munchen De pp. 270-275, P. Drews E.A. `Optisch-Elektronischer Nahtfuhrungssensor Zur Schweissnahverfolgung`.
Optical Engineering, vol. 24, No. 6, Nov. 1985, Bellingham US pp. 975-977, G. Bickel E.A. `Trianqulation With Expanded Range of Depth`.
C.G. Morgan et al., "Visual guidance techniques for robot arc-welding," Department of Engineering Science, pp. 390-399.
An Improvement on Two-dimensional Position Sensitive Semiconductor Device, Y. Terada et al., Japanese Journal of Optics, A Publication Of The Optics Division, The Japan Society Of Applied Physics, vol. 12, No. 5, 1983, pp. 367-373.
Silicon Position Sensing Detectors For Precision Measurement And Control, R.M. Madden, Proceedings Of The SPIE, vol. 153, Advance In Optical Meterology, 1978, pp. 101-107.
A Real-time Optical Profile Sensor For Robot Arc Welding, Oomen et al, Proceedings Of The SPIE, vol. 449, Intelligent Robots: RoViSeC3, 1983 pp. 62-71.
Development Of A Laser Based Sensor For Arc Welding Robot, G. Ito, Japan Industrial Robot Association, Robot, No. 54, pp. 58-65.
Nippon Telegraph and Telephone Corporation
Pham Hoa Q.
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