Object inspection apparatus

Image analysis – Histogram processing – For setting a threshold

Patent

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Details

209939, 250223B, 356240, 358101, 358106, 382 1, 382 48, G06K 900

Patent

active

050070967

ABSTRACT:
An object inspection apparatus having a light source for irradiating an object to be inspected, a pick-up device for picking up the object and generating an image signal thereof including a synchronizing signal, and an inspecting device for receiving the image signal to determine whether or not the object has a defect. The inspecting device includes a reference position detector for generating a reference position signal based upon an image signal in a first field of the image signal and the synchronizing signal; an inspection zone position setter storing an inspection zone of a predetermined shaped and for generating a control signal based on the reference position signal and the synchronizing signal; an inspection zone controller receiving the image signal from the pick-up device and the control signal and for delivering an image signal in a second field of the image signal from the pick-up device within an inspection zone determined by the control signal; and a judging device receiving the image signal from the inspection zone controller to determine whether or not the object has a defect.

REFERENCES:
patent: 3955179 (1976-05-01), Planke
patent: 4380025 (1983-04-01), Deane
patent: 4655349 (1987-04-01), Joseph et al.
patent: 4679075 (1987-07-01), Williams et al.
patent: 4691231 (1987-09-01), Fitzmorris et al.

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