Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-02-27
2007-02-27
Couso, Yon J. (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S181000, C382S282000, C348S135000
Reexamination Certificate
active
10757674
ABSTRACT:
A method for object detection that utilizes a patterned background. Patterned backgrounds are chosen such that each reference image analyzed will have both light and dark pixels. The method calculates the difference between the expected value for the light pixels and the expected value of the dark pixels in the reference image. This difference is used to chose a threshold value. The difference in expected values for the corresponding pixels in a live image is calculated and compared to the threshold value. If the difference in expected values of the live image are less than the threshold value, object detection is indicated.
REFERENCES:
patent: 4923066 (1990-05-01), Ophir et al.
patent: 5065237 (1991-11-01), Tsikos et al.
patent: D347442 (1994-05-01), Falconer
patent: D349713 (1994-08-01), Hasegawa
patent: D349714 (1994-08-01), Hasegawa
patent: D349911 (1994-08-01), Shimizu et al.
patent: D349913 (1994-08-01), Morris
patent: 5359363 (1994-10-01), Kuban et al.
patent: D354973 (1995-01-01), Hisatune et al.
patent: 5402168 (1995-03-01), Fouilloy
patent: 5418567 (1995-05-01), Boers et al.
patent: 5436462 (1995-07-01), Huli-Allen
patent: 5448320 (1995-09-01), Sakai et al.
patent: 5477212 (1995-12-01), Rumpel
patent: D365834 (1996-01-01), Dozier
patent: 5539199 (1996-07-01), Ruckh et al.
patent: 5573006 (1996-11-01), Shimotani et al.
patent: D378095 (1997-02-01), Hasegawa
patent: 5613013 (1997-03-01), Schuette
patent: 5627616 (1997-05-01), Sergeant et al.
patent: 5649255 (1997-07-01), Schieltz
patent: 5657076 (1997-08-01), Tapp
patent: 5677535 (1997-10-01), Stephan
patent: 5691765 (1997-11-01), Schieltz et al.
patent: 5731832 (1998-03-01), Ng
patent: 5745170 (1998-04-01), Palmer
patent: 5752100 (1998-05-01), Schrock
patent: 5790910 (1998-08-01), Haskin
patent: 5793900 (1998-08-01), Nourbakhsh et al.
patent: 5795306 (1998-08-01), Shimotani et al.
patent: 5801770 (1998-09-01), Paff et al.
patent: D399517 (1998-10-01), Hasegawa
patent: 5818519 (1998-10-01), Wren
patent: 5835218 (1998-11-01), Harding
patent: 5835613 (1998-11-01), Breed et al.
patent: 5845000 (1998-12-01), Breed et al.
patent: 5852754 (1998-12-01), Schneider
patent: 5870135 (1999-02-01), Glatt et al.
patent: 5878156 (1999-03-01), Okumura
patent: 5953055 (1999-09-01), Huang et al.
patent: 5953076 (1999-09-01), Astle et al.
patent: 5980123 (1999-11-01), Heifler
patent: 6035067 (2000-03-01), Ponticos
patent: 6286349 (2001-09-01), Muller et al.
patent: 6392754 (2002-05-01), Pingel et al.
patent: 6456320 (2002-09-01), Kuwano et al.
patent: 6456384 (2002-09-01), Kulawiec et al.
patent: 6496253 (2002-12-01), Vokhmin
patent: 6509967 (2003-01-01), Pingel et al.
patent: 6564166 (2003-05-01), Ume et al.
patent: 2004/0066970 (2004-04-01), Matsugu
patent: 0631430 (1994-06-01), None
patent: 0610863 (1994-08-01), None
patent: 0654684 (1995-05-01), None
patent: 0468839 (1995-09-01), None
patent: 0691632 (1996-01-01), None
patent: 0491121 (1996-02-01), None
patent: 0519379 (1996-09-01), None
patent: 0554197 (1996-10-01), None
patent: 0484076 (1996-12-01), None
patent: 0529317 (1996-12-01), None
patent: 0747868 (1996-12-01), None
patent: 0772169 (1997-05-01), None
patent: 0774730 (1997-05-01), None
patent: 0800152 (1997-10-01), None
patent: 0810791 (1997-12-01), None
patent: 0585033 (1998-01-01), None
patent: 0575220 (1998-03-01), None
patent: 0833503 (1998-04-01), None
patent: 0632858 (1998-08-01), None
patent: 0691632 (1998-10-01), None
patent: 1168269 (2001-05-01), None
patent: 07056219 (1993-08-01), None
patent: 07104362 (1993-10-01), None
patent: 07159892 (1993-12-01), None
patent: 07175128 (1993-12-01), None
patent: 07191390 (1993-12-01), None
patent: 07222039 (1994-01-01), None
patent: 07255004 (1994-03-01), None
patent: 07281276 (1994-04-01), None
patent: 08076213 (1994-09-01), None
patent: 08140941 (1994-11-01), None
patent: 09083999 (1995-09-01), None
patent: 09193078 (1996-01-01), None
patent: 10031256 (1996-07-01), None
patent: 10042231 (1996-07-01), None
patent: WO 84/03784 (1984-09-01), None
patent: WO 97/01246 (1997-01-01), None
patent: WO 97/05741 (1997-02-01), None
patent: WO 97/05744 (1997-02-01), None
patent: WO 97/12278 (1997-04-01), None
patent: WO 98/18026 (1998-04-01), None
patent: WO 98/46116 (1998-10-01), None
patent: WO 98/47025 (1998-10-01), None
patent: WO 0233671 (2002-04-01), None
Aach, T., et al., “Statistical Model-Based Change Detection in Moving Video,” Signal Processing, vol. 31, No. 2, pp. 165-180, Mar. 1993.
Asundi et al., “Digital moiré for measurements on cylindrical objects”, J. Opt. 29 (1998), pp. 128-134.
Asundi, et al., “Digital Moire applications in Automated Inspection”, SPIE vol. 2347, pp. 270-275, 0-8194-1682-7/94.
Barski, et al., “Characterization, detection and suppression of stationary grids in digital projection radiography imagery,” SPIE, vol. 3658, Feb. 1999.
Batouche, “A Knowledge Based System for diagnosing spinal deformations: Moire Pattern Analysis and Interpretation”, 11th IAPR International Conference on Pattern Recognition, pp. 591-594, The Hague, The Netherlands, Aug. 30-Sep. 3, 1992.
Blanco et al., “Study of Plate Vibrations by Moire Holography”, SPIE Vo. 1508, Industrial Applications of Holographic and Speckle measuring Techniques, pp. 180-190, 1991.
Bruynooghe et al., “Fast algorithms for automatic moiré fringe analysis. Application to non-contact measurements for quality control of industrial components”, SPIE vol. 2786, 0-8194-2172-3/96, pp. 54-67.
Bruynooghe, et al., “Real-time digital/optical system for quality control by moiré image processing”, SPIE vol. 3208, pp. 445-454, 0277-786X/97.
Campos et al., “Moire Interferometry With Psuedo-Random Screens”, SPIE vol. 1983 Optics as a Key to High Technology, pp. 724-725, (1993).
Chang et al., “Analysis of CCD moiré pattern with the wavelet transform”, Part of the SPIE Conference on Wavelet Applications VI, Orlando, Florida, Apr. 1999, pp. 420-428, SPIE vol. 3723 0277-786X/99.
Chang-Hua Hu and Yu-Wen Qin, “Digital color encoding and its application to the moire technique,” Applied Optics, vol. 36, No. 16, pp. 3682-3685, Jun. 1, 1997.
Fang, “Optical modulation and digital demodulation of an in-plane moiré carrier”, Optics & Laser Technology, vol. 23, No. 6, pp. 349-352, 1991.
Gallarda et al., “3-D Gradient and Curvature Measurement Using Local Image Information”, SPIE vol. 1194 Optics, Illumination, and Image Sensing for Machine Vision IV (1989), pp. 198-208.
Gazzero et al., “Restoration of Images Transmitted Through Coherent Fiber Bundles”, SPIE vol. 12332, Medical Imaging IV: Image Capture and Display, pp. 20-25, 1990.
Hotter, M., et al., “Image Segmentation Based on Object Oriented Mapping Parameter Estimation,” Signal Processing, vol. 15, No. 3, pp. 315-334, Oct. 1988.
Jianu et al., “Talbot-moire deflectometry with direct spatial reconstruction of optical phase”, SPIE vol. 3405 0277-786X/98, pp. 517-521.
Jinhong et al., “Temperature Mapping by Double Grating diffraction System with Microcomputer Image Process”, SPIE vol. 1230 International Conference on Optoelectronic Science and Engineering '90, pp. 196-198.
Krumm, et al., “Sampled-grating and crossed-grating models of moiré patterns from digital imaging”, Optical Engineering, vol. 30, No. 2, pp. 195-206, Feb. 1991.
Kunihiko Mori, et al., “Fringe pattern analysis using hybrid image processing”, Applied Optics, vol. 29, No. 11, pp. 1646-1817, Apr. 10, 1990.
Loske, et al., “Two-dimensional spatial correlator for lens-free image processing”, Optik, 103, No. 2, pp. 59-65, 1996.
Moran et al., “Automatic digitization and analysis of moiré topograms on a personal computer for clinical use”, Med. Eng. Phys., vol. 16, pp. 259-264, May 1994.
Morimoto et al., “Strain analysis by mismatch moiré method and grid method using Fourier transform
Cofer Darren Duane
Hamza Ridha M.
Couso Yon J.
Fredrick Kris T.
Honeywell International , Inc.
LandOfFree
Object detection does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Object detection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Object detection will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3887903