Semiconductor device manufacturing: process – Semiconductor substrate dicing
Reexamination Certificate
2008-02-14
2011-12-27
Chen, Jack (Department: 2893)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
C438S463000, C438S464000, C257SE21238
Reexamination Certificate
active
08084333
ABSTRACT:
An object cutting method which can reliably remove particles remaining on cut sections of chips is provided. An expandable tape23is electrically charged in a state where a plurality of semiconductor chips25obtained by cutting a planar object to be processed along a line to cut are separated from each other on the expandable tape23.This electric action causes particles remaining on cut sections of the semiconductor chips25to eject therefrom even when a molten processed region is formed in the cut sections. Therefore, particles remaining on the cut sections of the chips25can reliably be removed.
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Chen Jack
Drinker Biddle & Reath LLP
Hamamatsu Photonics K.K.
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