Optics: measuring and testing – Crystal or gem examination
Patent
1995-01-23
1996-04-23
Gonzalez, Frank
Optics: measuring and testing
Crystal or gem examination
356397, 359801, 359804, 2922515, G01N 2100, G02B 2702
Patent
active
055108911
ABSTRACT:
An object characteristic direct measuring device includes a lower base, a first annular magnetic element disposed in the lower base, and a holder member surrounded by the first magnetic element and being mounted by the lower base and adapted to receive and hold an object, such as a gem. The measuring device further includes an upper frame having a central aperture receiving an upper portion of the holder member, a transparent lens disposed across the top of the central aperture in the upper frame, a graduated measuring scale applied on the transparent lens for use in measuring a dimension of the gem held by the holder member mounted to the lower base, and a second annular magnetic element disposed in a bottom groove in the upper frame which surrounds the central aperture therein and magnetically attracts the first magnetic element in the lower base so as to retain the upper frame upon the lower base while permitting rotation of the upper frame relative to the lower base and holder member for alignment of the measuring scale with the desired dimension of the gem.
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Eisenberg Jason D.
Flanagan John R.
Gonzalez Frank
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