X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1991-03-04
1994-03-08
Dzierzynski, Paul M.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 83, 378 86, 378 57, G01N 2304
Patent
active
052934144
ABSTRACT:
The invention relates to an apparatus and method for detecting the presence of an element of interest within an object. The object is positioned where a beam of gamma rays of the required energy are directed to be scattered by the element of interest. The gamma rays are provided by excited atoms of the element of interest. The excited atoms result from the reaction of hydrogen or heavier ions and a suitable target. The excited atoms deexcite, releasing gamma rays which are scattered by the element of interest within the object. The scattered gamma rays are detected, output signals are produced, processed and analyzed to determine the amount of the element of interest within the object. A preferred embodiment relates to the detection of nitrogen-based explosives in luggage.
REFERENCES:
patent: 3171961 (1965-03-01), Yule et al.
patent: 3780294 (1973-12-01), Sowerby
patent: 5040200 (1991-08-01), Ettinger et al.
Brondo Joseph H.
Ettinger Kamil V.
Dzierzynski Paul M.
Scientific Innovations, Inc.
Wong Don
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