Notched electrical test probe tip

Details Notched electrical test probe tip Notched electrical test probe tip

2000-07-31

2001-07-10

Davis, Antoine Duval (Department: 2913)

Measuring, testing, or signalling instruments

Measuring, regulating or indicating instrument, or casing

Electrical property

Design Patent

active

D0444720

CLAIM:
The ornamental design for a notched electrical test probe tip, as shown and described.

REFERENCES:
patent: D. 400811 (1998-11-01), Swart et al.
patent: D. 422518 (2000-04-01), Luebke

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