Optics: measuring and testing – Standard
Reexamination Certificate
2005-03-22
2008-08-26
Evans, F. L. (Department: 2877)
Optics: measuring and testing
Standard
C436S008000
Reexamination Certificate
active
07417726
ABSTRACT:
An apparatus for normalizing a PCR instrument, can comprise a microplate comprising at least 6,000 wells and a system of dyes at known concentrations in a plurality of the at least 6,000 wells. A method for normalizing a system can comprise (a) providing a microplate comprising at least 6,000 wells and a system of dyes; (b) exciting at least one dye; (c) detecting an emission output for the at least one dye; (d) determining if the emission output is in an acceptable range; and (e) adjusting the system so that the emission output is in the acceptable range.
REFERENCES:
patent: 5188934 (1993-02-01), Menchen et al.
patent: 5538848 (1996-07-01), Livak et al.
patent: 5728528 (1998-03-01), Mathies et al.
patent: 5736333 (1998-04-01), Livak et al.
patent: 5750409 (1998-05-01), Herrmann et al.
patent: 5800996 (1998-09-01), Lee et al.
patent: 5847162 (1998-12-01), Lee et al.
patent: 5853992 (1998-12-01), Glazer et al.
patent: 5863727 (1999-01-01), Lee et al.
patent: 5925517 (1999-07-01), Tyagi et al.
patent: 5936087 (1999-08-01), Benson et al.
patent: 5945526 (1999-08-01), Lee et al.
patent: 5986086 (1999-11-01), Brush et al.
patent: 6008373 (1999-12-01), Waggoner et al.
patent: 6008379 (1999-12-01), Benson et al.
patent: 6015667 (2000-01-01), Sharaf
patent: 6020481 (2000-02-01), Benson et al.
patent: 6103476 (2000-08-01), Tyagi et al.
patent: 6130101 (2000-10-01), Mao et al.
patent: 6140494 (2000-10-01), Hamilton et al.
patent: 6140500 (2000-10-01), Yan et al.
patent: 6150097 (2000-11-01), Tyagi et al.
patent: 6154707 (2000-11-01), Livak et al.
patent: 6191278 (2001-02-01), Lee et al.
patent: 6221604 (2001-04-01), Upadhya et al.
patent: 6329164 (2001-12-01), Goodwin, Jr.
patent: 6333501 (2001-12-01), Labrenz
patent: 6335440 (2002-01-01), Lee et al.
patent: 6355421 (2002-03-01), Coull et al.
patent: 6471916 (2002-10-01), Noblett
patent: 6485901 (2002-11-01), Gildea et al.
patent: 6632809 (2003-10-01), Grillot et al.
patent: 6653300 (2003-11-01), Bebbington et al.
patent: 6653301 (2003-11-01), Bebbington et al.
patent: 6664247 (2003-12-01), Bebbington et al.
patent: 2001/0048899 (2001-12-01), Marouiss et al.
patent: 2004/0126763 (2004-07-01), Nampalli et al.
patent: 0233053 (1994-06-01), None
patent: WO 91/05060 (1991-04-01), None
patent: WO 94/05688 (1994-03-01), None
patent: WO 94/27719 (1994-12-01), None
patent: WO 95/11262 (1995-04-01), None
patent: WO 97/37036 (1997-10-01), None
patent: WO 99/21881 (1999-05-01), None
patent: WO 00/13026 (2000-03-01), None
patent: 2002/052038 (2002-07-01), None
Yang, M.C.K. et al. A Statistical Method for Flagging Weak Spots Improves Normalization and Ratio Estimates in Microarrays, Physiol Genomics, Aug. 2001, vol. 7, pp. 45-53.
International Search Report for International Application No. PCT/US2006/10291 dated May 24, 2007 along with the Written Opinion of the International Searching Authority.
International Preliminary Report on Patentability for International Application No. PCT/US2006/10291 dated Sep. 25, 2007.
Harding Ian A.
Kao H. Pin
Karger Achim
Oldham Mark F.
Ostadan Omead
Applied Biosystems Inc.
Evans F. L.
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