Nonvolatile semiconductor storage unit

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S203000

Reexamination Certificate

active

06999348

ABSTRACT:
A nonvolatile semiconductor storage unit can prevent erratic sense operations in a sense latch circuit by adopting a single-end sensing system capable of reducing an area (decreasing the number of elements). There is provided a flash memory chip using the single-end sensing system and an NMOS gate sensing system together. In the single-end sensing system, the sense latch circuit is connected to one end of a global bit line to detect data on the global bit line corresponding to a threshold voltage for a memory cell. The NMOS gate sensing system uses an NMOSFET to receive data on the global bit line at a gate and drive a node for the sense latch circuit. The NMOSFET senses a sense voltage. The sense latch circuit is activated with a sufficient signal quantity ensured. An output voltage from a threshold voltage applying power supply precharges the global bit line. In this manner, it is possible to always keep a constant difference between a precharge voltage and a threshold voltage for the NMOSFET.

REFERENCES:
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patent: 6525960 (2003-02-01), Yoshida et al.
patent: 7-307098 (1995-11-01), None
patent: 10-188576 (1998-07-01), None
patent: 11-250681 (1999-09-01), None
K. Imamiya et al., “MP6.6 A 130 mm2256 Mb NAND Flash with Shallow Trench Isolation Technology”,1999 IEEE International Solid-State Circuits Conference.
K. Suh et al., “TA7.5: A 3.3V 32 Mb NAND Flash Memory with Incremental Step Pulse Programming Scheme”,1995 IEEE International Solid-State Circuits Conference, pp. 128-129.
K. Imamiya et al., “TA7.6: A 35 ns-Cycle-Time 3.3V-Only 32 Mb NAND Flash EEPROM”,1995 IEEE International Solid-State Circuits Conference, pp. 130-131.

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