Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2005-09-27
2005-09-27
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185290, C365S185180, C365S185220
Reexamination Certificate
active
06950347
ABSTRACT:
A nonvolatile memory device of the present invention performs a programming operation by accumulating a charge in certain capacitance which is provided for each programming memory cell and injecting hot electrons generated when the charge is discharged via the memory cell into a floating gate. Thus, a variation in a programming characteristic of the nonvolatile semiconductor memory device is reduced, thereby realizing high-speed programming operation.
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Hitoshi Kume, “Applied Physics”, vol. 65, No. 11, pp. 1114-1124, The Japan Society of Applied Physics on Jan. 10, 1996.
International Search Report.
Kawahara Takayuki
Kobayashi Naoki
Kobayashi Takashi
Kurata Hideaki
Saeki Shun-ichi
Antonelli, Terry Stout and Kraus, LLP.
Hitachi Device Engineering Co.
Hitachi ULSI System Co., Ltd.
Hoang Huan
Renesas Technology Corp.
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