Nonvolatile semiconductor memory using an adjustable...

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

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Details

C365S185070, C365S154000

Reexamination Certificate

active

07969780

ABSTRACT:
An object of this invention is to provide a rewritable nonvolatile memory cell that can have a wide reading margin, and can control both a word line and a bit line by changing the level of Vcc. As a solution, a flip-flop is formed by cross (loop) connect of inverters including memory transistors that can control a threshold voltage by charge injection into the side spacer of the transistors. In the case of writing data to one memory transistor, a high voltage is supplied to a source of the memory transistor through a source line and a high voltage is supplied to a gate of the memory transistor through a load transistor of the other side inverter. In the case of erasing the written data, a high voltage is supplied to the source of the memory transistor through the source line.

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