Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2011-08-30
2011-08-30
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185110, C365S185220, C365S185080
Reexamination Certificate
active
08009480
ABSTRACT:
According to an embodiment, a nonvolatile semiconductor memory system includes: a nonvolatile semiconductor memory; and a memory controller having: a memory interface unit that inputs commands to the nonvolatile semiconductor memory and inputs or outputs data between the nonvolatile semiconductor memory; a memory that stores writing information indicating a memory cell transistor that is written the latest in each of the NAND cell units; and a processor that sets a read voltage based on the writing information to read out data from the memory cell transistors connected to a first word line; wherein a row controller is configured to set a plurality of levels of the read voltage to be applied to the first word line, with respect to one threshold for discriminating data stored in a memory cell transistors.
REFERENCES:
patent: 5862083 (1999-01-01), Tobita et al.
patent: 6574147 (2003-06-01), Tanaka et al.
patent: 7248493 (2007-07-01), Takashima et al.
patent: 7570513 (2009-08-01), Li et al.
patent: 2005/0068802 (2005-03-01), Tanaka
patent: 2006/0227624 (2006-10-01), Shiga
patent: 2006/0274566 (2006-12-01), Takashima et al.
patent: 2007/0253256 (2007-11-01), Aritome
patent: 2006186359 (2006-07-01), None
Abiko Naofumi
Futatsuyama Takuya
Hoang Huan
Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
LandOfFree
Nonvolatile semiconductor memory system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Nonvolatile semiconductor memory system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nonvolatile semiconductor memory system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2708490