Nonvolatile semiconductor memory device which stores...

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S185180, C365S185190, C365S236000

Reexamination Certificate

active

11401421

ABSTRACT:
A voltage generating circuit supplies first gate voltage to the control gate of a memory cell for a first control time period and supplies write voltage to the drain for a first write time period which is shorter than the first control time period when an operation of writing data into the memory cell is started. As the verify result, if it is detected that a data amount written into the memory cell is insufficient, the voltage generating circuit supplies second control voltage obtained by raising the first control gate voltage by constant voltage to the control gate for a time period which is shorter than the first control time period and supplies write voltage to the drain for a second write time period which is shorter than the first write time period.

REFERENCES:
patent: 5946231 (1999-08-01), Endoh et al.
patent: 6655758 (2003-12-01), Pasotti et al.
patent: 6788579 (2004-09-01), Gregori et al.
patent: 6937520 (2005-08-01), Ono et al.
patent: 11-39887 (1999-02-01), None

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