Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2005-03-22
2005-03-22
Ho, Hoai (Department: 2818)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185290, C365S185330
Reexamination Certificate
active
06870771
ABSTRACT:
In a memory block that is to be subjected to an erasure operation, voltage of the ground level is selectively supplied to only one word line. By applying an erasure pulse to a source line, memory cell transistors have their threshold voltages shifted. As to another word line, a pulse of a positive voltage is supplied in synchronization to the application of an erasure pulse to the source line. Another group of memory cell transistors do not have their threshold voltages shifted.
REFERENCES:
patent: 5297096 (1994-03-01), Terada et al.
patent: 5428568 (1995-06-01), Kobayashi et al.
patent: 5793678 (1998-08-01), Kato et al.
patent: 5920508 (1999-07-01), Miyakawa et al.
Makino Toshimasa
Ohba Atsushi
Tomoeda Mitsuhiro
Ho Hoai
Ho Tu-Tu
Mitsubishi Electric Engineering Company Limited
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