Nonvolatile semiconductor memory circuit utilizing a MIS...

Static information storage and retrieval – Read only systems – Semiconductive

Reexamination Certificate

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Details

C365S103000, C365S154000, C365S190000, C365S189050, C365S189070

Reexamination Certificate

active

07821806

ABSTRACT:
A memory circuit includes a latch having a first node and a second node to store data such that a logic level of the first node is an inverse of a logic level of the second node, a MIS transistor having a gate node, a first source/drain node, and a second source/drain node, the first source/drain node coupled to the first node of the latch, and a control circuit configured to control the gate node and second source/drain node of the MIS transistor in a first operation such that a lingering change is created in transistor characteristics of the MIS transistor in response to the data stored in the latch, wherein the MIS transistor includes a highly-doped substrate layer, a lightly-doped substrate layer disposed on the highly-doped substrate layer, diffusion regions formed in the lightly-doped substrate layer, a gate electrode, sidewalls, and an insulating film.

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