Nonvolatile semiconductor memory

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Details

357 6, 357 235, 357 2315, H01L 2934, H01L 2978

Patent

active

048686328

ABSTRACT:
In an MONOS type nonvolatile semiconductor memory comprising a channel forming semiconductor region between source and drain regions in a surface of a substrate; a tunnel insulating film formed on the channel forming semiconductor region in the surface of the substrate, the tunnel insulating film permitting charge-injection; a silicon nitride film formed as a second insulating film on the tunnel insulating film; a silicon oxide film formed as a third insulating film; and a conductive electrode formed on the silicon oxide film, the silicon nitride film has a composition close to a stoichiometric value of Si.sub.3 N.sub.4 at a portion near an interface with the tunnel insulating film and has a composition of excess silicon at a portion of the thickness of the same film except near the interface with the tunnel insulating film.

REFERENCES:
patent: 4519051 (1985-05-01), Fuji
patent: 4618541 (1986-10-01), Forouhi et al.

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