Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1998-10-06
1999-12-21
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356345, G01B 902
Patent
active
060056649
ABSTRACT:
A method for deriving a spectrum of a substance in such a manner as to enhance a specified characteristic of the spectrum. Irregular intervals are chosen in the signal domain for sampling the signal. The irregular intervals may be randomly spaced. The signal is sampled at the irregular intervals and transformed into the transform domain through application of a transform algorithm, such as a fast orthogonal search, capable of accommodating an irregularly sampled signal. Interferometric spectrometers having parallel optical paths with irregularly spaced phase delays are provided for the practice of the claimed method.
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Brenan Colin J. H.
Hunter Ian W.
Korenberg Michael J.
Kim Robert H.
Massachusetts Institute of Technology
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